AIST Researchers Develop Ruthenium and Diamond Power Diodes for Sustained High-Temperature Operation Without Cooling
30 March 2009
Overview of the Schottky Barrier Diode with the cross-section schematic (right). (2 x 2 mm device chip is indicated by the circle.) Click to enlarge. |
Researchers at Japan’s National Institute of Advanced Industrial Science and Technology (AIST) earlier this year reported the development of rectifying diodes using ruthenium (Ru) and diamond for power devices that are operational at high temperatures exceeding 400 °C for long periods. If this technology were to be commercialized, it could enable energy-saving non-cooled power devices.
Semiconductor power devices are essential for power control of electrical equipment; the devices are rapidly finding new applications including motor drive units for hybrid and electric cars. There is an urgent need for innovation to reduce electric power consumption by developing advanced power device technology; the issue is included in the “Cool Earth—Innovative Energy Technology Plan” of the Ministry of Economy, Trade and Industry for greatly reducing CO2 emissions.
In this study, rectifying diodes as essential elements of power devices were experimentally fabricated and long-term stability was demonstrated at high temperatures. Until now, it has generally been believed that the electrodes of Schottky diodes cannot withstand high-temperature operation for extended periods. Among the materials that the AIST explored for a Schottky electrode, Ru performed exceptionally in addressing the four challenges of thermal stability, low resistance, good adhesion, and the feasibility of Schottky junctions. It is also stable at high temperature.
The IV characteristics of a Ru/diamond Schottky barrier diode after the storage at 400 °C for 1500 h. Click to enlarge. |
New rectifying diodes were experimentally fabricated using Ru for the Schottky electrode and diamond for the substrate. The devices were confirmed to be free of degradation through operation tests at 400 °C for 1,500 hours and at 500 °C for 250 hours. At self-heating temperatures such as from 200 to 250 °C, the test data suggests that the devices would operate for several decades without cooling.
The results of the study were published in the Japan Society of Applied Physics’ journal Applied Physics Express.
Today, silicon (Si) is exclusively used in power devices, but the material has inherent problems with regard to thermal stability, high-voltage operation, power loss, and current density. To resolve these problems, new materials such as silicon carbide (SiC) and gallium nitride (GaN) are now being developed.
Diamond is another promising material with specific properties: it is in itself the best-known heat-sink material, withstands high temperatures, and has the distinctive feature of the current becoming greater at higher temperatures. For application to power devices, these strong merits make diamond a promising material for realizing high-temperature non-cooled devices with high-voltage, large-current capabilities.
The Diamond Research Center at AIST is exploring possibilities for fully utilizing the semiconducting characteristics of diamond in combination with its superior properties, which include excellent hardness, thermal conductivity, elastic modulus, optical transparency, chemical stability, and electrochemical properties. As part of the material technology, developments are also being made in the technology for fabricating large-sized single crystals of diamond. For the utilization of diamond in power devices, various types of devices and materials are presently being studied.
The AIST study aimed at developing Schottky rectifying diodes with large-current, high-temperature, and non-cooled operation. So far, such metals as aluminum (Al), gold (Au), molybdenum (Mo), and platinum (Pt) and a compound material, tungsten carbide (WC), have been widely used to form Schottky junctions with diamond. Although the Pt Schottky junction has good thermal stability compared with the other metals, it is not likely to be used due to unavoidable interfacial peeling. WC has not yet been fully examined for thermal stability, but it is reported that, at 500 °C, the device characteristics can change within 3 hours. Other demerits of WC are that its resistivity is more than an order of magnitude larger than those of the other metals, and a metal like gold is additionally needed for wire connections.
In the AIST study, various metals were examined as candidates for Schottky electrode material to realize high-temperature operation. For metals endowed with excellent electrical and thermal conductivity, various characteristics were examined with Schottky junctions, including adhesion strength and thermal stability. Note that there has been no reported metal having excellent properties with regard to thermal and electrical conductivity, adhesiveness, and Schottky junction characteristics. Needless to say, interfacial reaction at high temperatures should not cause any degradation. This study is the first to show that ruthenium (Ru) satisfies all the criteria, and to demonstrate the fabrication of diodes using ruthenium and diamond.
The various properties of the Schottky junctions were studied in detail, and no variation in the properties was observed after 1,500 hours at 400°C. At self-heating temperatures such as from 200 to 250°C, the data indicates that the device would operate for several decades without cooling. This suggests the possibility of reducing the electrical power consumed for cooling, which has been considered unavoidable in power devices.
For practical application to power devices, diamond devices must have an area as large as 1 cm2 or more in order to handle large currents. To meet this objective, AIST plans to work on the technology for fabricating large-area substrate, for high-quality epitaxial film growth, and for device design. While the present study focuses on the development of Schottky diodes, AIST will also pursue transistor devices that can be used as energy-saving power devices without cooling.
Resources
Kazuhiro Ikeda, Hitoshi Umezawa, Kumaresan Ramanujam, and Shin-ichi Shikata (2009) Thermally Stable Schottky Barrier Diode by Ru/Diamond. Appl. Phys. Express 2 011202 (3 pages) doi: 10.1143/APEX.2.011202
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